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  • Delphi microscope for metallurgical materials testing
  • Delphi microscope for metallurgical materials testing
  • Delphi microscope for metallurgical materials testing
  • Delphi microscope for metallurgical materials testing
  • Delphi microscope for metallurgical materials testing
  • Delphi microscope for metallurgical materials testing
  • Delphi microscope for metallurgical materials testing
  • Delphi microscope for metallurgical materials testing

Delphi microscope for metallurgical materials testing

Order number: DX.2053-PLMRi
€14.500,00 *

* Price without VAT - plus Shipping costs

Delphi-X Observer with Plan Semi-Apochromatic and Plan Apochromatic objectives with infinity correction for brightfield and darkfield

On backorder

TECHNICAL DATA:

OKULARS:

Super wide field SWF 10x/25 mm, Ø 30 mm tubes
Extended wide field EWF 10x/22 mm, Ø 30 mm tubes (optional)

STANDARD HEAD:

Siedentopf trinocular head with 30° inclined tubes. Adjustable interpupillary distance (47- 78 mm). The standard trinocular head has an optical lever to adjust the light path (100:0 / 80:20 / 0:100). Diopter adjustment on both eyepieces

ERGONOMIC TILT HEAD:

Optional, ergonomic, 0 to 35 ° tiltable trinocular head with SWF eyepieces (10x/25 mm), pupil distance between 47-78 mm and phototube with standard Ø 23.2 mm. The trinocular tilt head has an optical lever to adjust the light path (100:0 / 80:20 / 0:100). Diopter ± 5 settings for both eyepieces

NOSEPIECE:

Rear inclined revolving nosepiece on ball bearing for Six objectives with 26 mm objective thread

ENHANCED INFINITY SYSTEM (EIS):

The Delphi-X Observer™ Extended Infinity System (EIS)consists of super wide-angle SFWF eyepieces (10x/25 mm), high numerical aperture parfocal objectives (45 mm) and a 200 mm focal length tube lens. The 200 mm focal length tube lens reduces the angle of the light rays passing through the optics. This results in a significant improvement in corrections for chromatic aberrations and contrast. The larger diameter lenses have a much higher numerical aperture, which improves the overall resolving power of the optical system. With all these features, the Delphi-X Observer™ offers outstanding optical performance for demanding applications.

OBJECTIVES:

The Delphi-X Observer™ comes standard with one each of Plan Semi-Apochromatic BD 5x/0.15 BD 20 mm, 10x/0.30 WD 11 mm and 20x/0.45 WD 3.1 mm Plan Apochromatic BD 50x/0.80 WD 1 mm objectives with infinity correction for brightfield/darkfield. Optionally, the objectives 100x/0.90 WD 1 mm and 2x/0.06 Plan PLMi are available.

Plan Semi-Apo (SAMi)

  • 5x/0.15
  • 10x/0.30
  • 20x/0.45

Plan Apo (PLAMi)

  • 50x/0.80
  • 100x/0.90* optional

Plan (PLMi)

  • 2x/0.06* optional (including adapter ring RMS/M26 thread)

All objectives are parafocal 45 mm and have a mounting thread of M26 mm. All objectives are anti-fungus treated and AR coated for maximum light transmission.

OBJECT TABLE:

215 x 170 mm stage with integrated right-handed 105 x 105 mm cross stage. The stage height can be lowered for large specimens (standard specimen size 1 to 28 mm, specimen size 55 mm). The specimen stage can be mounted in two positions.

TURRET LOWERING ATTACHMENT:

The turret lowering attachment lowers the height of the turret 40 mm, allowing the stage to be used in the lower 40 mm position. (DX.9887).

OCULAR HEIGHT ADJUSTMENT:

The eyepieces can be adjusted in height by 25 mm (DX.9885).

FOCUS ADJUSTMENT:

Coaxial coarse and fine drive, 100 graduations, 1 µm precision, 100 μm per revolution. The total travel range is approximately 35 mm. Supplied with an adjustable stage stop thus avoiding damage to the specimen and objective. The coarse adjustments are equipped with friction control. The focusing knobs can be changed from left to right according to the user's preference.

LONG (W.D.) CONDENSER:

The condenser, adjustable in height long working distance N.A. 0.65 (10.2 mm) with numerical markings for aperture, allows easy adjustment.

ILLUMINATION:

The Materials Science Microscope Delphi-X Observer is equipped with Epi and Diascopic intensity adjustable 100W halogen illumination with internal 100-240V power supply and Diascopic intensity adjustable 100 W halogen illumination with internal 100-240 Vac power supply. The diascopic halogen illumination has two neutral filters (push-in / push-out) for uniform attenuation of light intensity for all types of specimens.

The microscope comes standard with an analyzer and polarizer that can be easily inserted into the free slots of the epi-illuminator to obtain polarized images of high quality. Furthermore, a rotating cassette is implemented for fast switching between darkfield, brightfield and dimmed brightfield.

NOMARSKI DIC (optional):

With the redesign of the DIC module, the visualization of height differences that cannot normally be displayed using brightfield techniques has been significantly improved. These relief images are ideal for surface inspection of wafers, LCD screens, etc.

ICARE SENSOR:

The unique iCare Sensor was developed to avoid unnecessary energy loss. The microscope's illumination automatically turns off when the user moves away from its position.

CARRY HANDLE:

The integrated carrying handle on the back of the microscope ensures safe transport of the microscope, and the integrated tool and holder ensure that the right tool is always available.

ACCESSORIES AND PACKAGING:

Comes with power cord, dust cover, a spare fuse, instruction manual and universal tool. All packed in a styrofoam box.

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